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High temperature time dependent dielectric breakdown of power MOSFETs

Manca, J. ; Croes, K. ; De Ceuninck, W. ; De Schepper, L. ; Dieval, B. ; Hartnagel, H. L.
Papanicolaou, Nick (ed.) Naval Research Laboratory (Corporate Creator) (2000):
High temperature time dependent dielectric breakdown of power MOSFETs.
In: Reliabiblity, lifetime and testing : session V, pp. o. A., [Book Section]

Item Type: Book Section
Erschienen: 2000
Editors: Papanicolaou, Nick
Creators: Manca, J. ; Croes, K. ; De Ceuninck, W. ; De Schepper, L. ; Dieval, B. ; Hartnagel, H. L.
Title: High temperature time dependent dielectric breakdown of power MOSFETs
Language: English
Title of Book: Reliabiblity, lifetime and testing : session V
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Microwave Electronics
Date Deposited: 19 Nov 2008 16:22
Official URL: https://www.academia.edu/25577544/Reliability_of_Commercial_...
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