Manca, J. ; Croes, K. ; De Ceuninck, W. ; De Schepper, L. ; Dieval, B. ; Hartnagel, H. L.
Hrsg.: Papanicolaou, Nick ; Naval Research Laboratory (2000)
High temperature time dependent dielectric breakdown of power MOSFETs.
In: Reliabiblity, lifetime and testing : session V
Buchkapitel, Bibliographie