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Number of items: 6.

Papaléo, R. M. and Thomaz, R. and Gutierres, L. I. and de Menezes, V. M. and Severin, D. and Trautmann, C. and Tramontina, D. and Bringa, E. M. and Grande, P. L. (2015):
Confinement Effects of Ion Tracks in Ultrathin Polymer Films.
In: Physical Review Letters, APS Publications, p. 118302, 114, (11), ISSN 0031-9007,
[Online-Edition: http://dx.doi.org/10.1103/PhysRevLett.114.118302],
[Article]

Ruestes, C. J. and Stukowski, A. and Tang, Y. and Tramontina, D. R. and Erhart, P. and Remington, B. A. and Urbassek, H. M. and Meyers, M. A. and Bringa, E. M. (2014):
Atomistic simulation of tantalum nanoindentation: Effects of indenter diameter, penetration velocity, and interatomic potentials on defect mechanisms and evolution.
In: Materials Science and Engineering: A, Elsevier Science Publishing, pp. 390-403, 613, ISSN 09215093,
[Online-Edition: http://dx.doi.org/10.1016/j.msea.2014.07.001],
[Article]

Ruestes, C. J. and Bringa, E. M. and Stukowski, A. and Rodríguez Nieva, J. F. and Tang, Y. and Meyers, M. A. (2014):
Plastic deformation of a porous bcc metal containing nanometer sized voids.
In: Computational Materials Science, Elsevier Science Publishing, pp. 92-102, 88, ISSN 09270256,
[Online-Edition: http://dx.doi.org/10.1016/j.commatsci.2014.02.047],
[Article]

Erhart, P. and Bringa, E. M. and Kumar, M. and Albe, K. (2005):
Atomistic mechanism of shock-induced void collapse in nanoporous metals.
In: Phys. Rev. B, American Physical Society, pp. 052104-1, 72, (5), [Online-Edition: http://prb.aps.org/abstract/PRB/v72/i5/e052104],
[Article]

Davila, L. P. and Erhart, Paul and Bringa, E. M. and Meyers, M. A. and Lubarda, V. A. and Schneider, M. S. and Becker, R. and Kumar, M. (2005):
Atomistic modeling of shock-induced void collapse in copper.
In: Applied Physics Letters, pp. 161902-1(1-3), 86, [Article]

Bringa, E. M. and Cazamias, J. U. and Erhart, Paul and Stölken, J. and Tanushev, N. and Wirth, B. D. and Rudd, R. E. and Caturla, M. J. (2004):
Atomistic shock Huoniot simulation of single-crystal copper.
In: Journal of applied physics, p. 3793, 96, [Article]

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