Krawczyk, S. K. ; Bejar, M. ; Nuban, N. F. ; Blanchet, R. C. ; Kostka, A. ; Warta, W. ; Joly, J. P.
Hrsg.: Doneker, J. (1997)
New scanning photoluminescence technique for quantitative mapping of the lifetime and of the doping density in processed silicon wafers.
Seventh Conference on Defect Recognition and Image Processing. Templin (7.-10. September 1997)
Konferenzveröffentlichung, Bibliographie