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Engel, Michael ; Steiner, Mathias ; Sundaram, Ravi S. ; Krupke, Ralph ; Green, Alexander A. ; Hersam, Mark C. ; Avouris, Phaedon :
Spatially Resolved Electrostatic Potential and Photocurrent Generation in Carbon Nanotube Array Devices.
[Online-Edition: http://dx.doi.org/10.1021/nn302416e]
In: ACS Nano p. 120713100926001. ISSN 1936-0851
[Artikel], (2012)

Engel, Michael ; Steiner, Mathias ; Lombardo, Antonio ; Ferrari, Andrea C. ; Löhneysen, Hilbert v. ; Avouris, Phaedon ; Krupke, Ralph :
Light–matter interaction in a microcavity-controlled graphene transistor.
[Online-Edition: http://dx.doi.org/10.1038/ncomms1911]
In: Nature Communications, 3 p. 906. ISSN 2041-1723
[Artikel], (2012)

Steiner, Mathias ; Engel, Michael ; Lin, Yu-Ming ; Wu, Yanqing ; Jenkins, Keith ; Farmer, Damon B. ; Humes, Jefford J. ; Yoder, Nathan L. ; Seo, Jung-Woo T. ; Green, Alexander A. ; Hersam, Mark C. ; Krupke, Ralph ; Avouris, Phaedon :
High-frequency performance of scaled carbon nanotube array field-effect transistors.
[Online-Edition: http://dx.doi.org/10.1063/1.4742325]
In: Applied Physics Letters, 101 (5) 053123. ISSN 00036951
[Artikel], (2012)

Rauhut, Nina ; Engel, Michael ; Steiner, Mathias ; Krupke, Ralph ; Avouris, Phaedon ; Hartschuh, Achim :
Antenna-Enhanced Photocurrent Microscopy on Single-Walled Carbon Nanotubes at 30 nm Resolution.
[Online-Edition: http://dx.doi.org/10.1021/nn301979c]
In: ACS Nano, 6 (7) pp. 6416-6421. ISSN 1936-0851
[Artikel], (2012)

Sundaram, Ravi S. ; Steiner, Mathias ; Chiu, Hsin-Ying ; Engel, Michael ; Bol, Ageeth A. ; Krupke, Ralph ; Burghard, Marko ; Kern, Klaus ; Avouris, Phaedon :
The Graphene–Gold Interface and Its Implications for Nanoelectronics.
[Online-Edition: http://dx.doi.org/10.1021/nl201907u]
In: Nano Letters, 11 (9) pp. 3833-3837. ISSN 1530-6984
[Artikel], (2011)

Kinoshita, Megumi ; Steiner, Mathias ; Engel, Michael ; Small, Joshua P. ; Green, Alexander A. ; Hersam, Mark C. ; Krupke, Ralph ; Mendez, Emilio E. ; Avouris, Phaedon :
The polarized carbon nanotube thin film LED.
[Online-Edition: http://dx.doi.org/10.1364/OE.18.025738]
In: Optics Express, 18 (25) pp. 25738-25745. ISSN 1094-4087
[Artikel], (2010)

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