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Antenna-Enhanced Photocurrent Microscopy on Single-Walled Carbon Nanotubes at 30 nm Resolution

Rauhut, Nina and Engel, Michael and Steiner, Mathias and Krupke, Ralph and Avouris, Phaedon and Hartschuh, Achim (2012):
Antenna-Enhanced Photocurrent Microscopy on Single-Walled Carbon Nanotubes at 30 nm Resolution.
In: ACS Nano, pp. 6416-6421, 6, (7), ISSN 1936-0851,
[Online-Edition: http://dx.doi.org/10.1021/nn301979c],
[Article]

Abstract

We present the first photocurrent measurements along single carbon nanotube (CNT) devices with 30 nm resolution. Our technique is based on tip-enhanced near-field optical microscopy, exploiting the plasmonically enhanced absorption controlled by an optical nanoantenna. This allows for imaging of the zero-bias photocurrent caused by charge separation in local built-in electric fields at the contacts and close to charged particles that cannot be resolved using confocal microscopy. Simultaneously recorded Raman scattering images reveal the structural properties and the defect densities of the CNTs. Antenna-enhanced scanning photocurrent microscopy extends the available set of scanning-probe techniques by combining high-resolution photovoltaic and optical probing and could become a valuable tool for the characterization of nanoelectronic devices.

Item Type: Article
Erschienen: 2012
Creators: Rauhut, Nina and Engel, Michael and Steiner, Mathias and Krupke, Ralph and Avouris, Phaedon and Hartschuh, Achim
Title: Antenna-Enhanced Photocurrent Microscopy on Single-Walled Carbon Nanotubes at 30 nm Resolution
Language: English
Abstract:

We present the first photocurrent measurements along single carbon nanotube (CNT) devices with 30 nm resolution. Our technique is based on tip-enhanced near-field optical microscopy, exploiting the plasmonically enhanced absorption controlled by an optical nanoantenna. This allows for imaging of the zero-bias photocurrent caused by charge separation in local built-in electric fields at the contacts and close to charged particles that cannot be resolved using confocal microscopy. Simultaneously recorded Raman scattering images reveal the structural properties and the defect densities of the CNTs. Antenna-enhanced scanning photocurrent microscopy extends the available set of scanning-probe techniques by combining high-resolution photovoltaic and optical probing and could become a valuable tool for the characterization of nanoelectronic devices.

Journal or Publication Title: ACS Nano
Volume: 6
Number: 7
Divisions: 11 Department of Materials and Earth Sciences > Material Science > Fachgebiet Molekulare Nanostrukturen
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences
Date Deposited: 16 Aug 2012 07:18
Official URL: http://dx.doi.org/10.1021/nn301979c
Identification Number: doi:10.1021/nn301979c
Alternative keywords:
Alternative keywordsLanguage
single-walled carbon nanotubes;optical antennas; tip-enhanced near-field optical microscopy; scanning photocurrent microscopy; nanoscale devicesEnglish
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