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Anzahl der Einträge: 9.

Amjadi, Houman ; Franz, C.-F. :
An electret floppy disk for digital information storage.
In: Journal of electrostatics, 50 pp. 265-277.
[Artikel], (2001)

Amjadi, Houman :
Electret membranes and backelectrodes for application in micromechanical transducers.
In: Journal of electrostatics, 48 pp. 179-191.
[Artikel], (2000)

Amjadi, Houman :
The mechanism of voltage decay in cornea-charged layers of silicon dioxide during UV irradiation.
In: IEEE Transactions of dielectrics and electrical insulation, 7 pp. 222-228.
[Artikel], (2000)

Amjadi, Houman ; Sessler, Gerhard M. :
Mechanism of charge decay in UV-irradiated SiO2 electret films.
In: Conference on Electrical Insulation and Dielectric Phenomena <68, 1999, Austin, Texas>: Proceedings. - New York, NY: IEEE, 1999. S. 78-81 . IEEE , New York, NY
[Konferenz- oder Workshop-Beitrag], (1999)

Amjadi, Houman :
Untersuchungen zur Einsatzfähigkeit anorganischer Dielektrika als Elektretschicht in mikromechanischen Wandlern.
Shaker , Aachen
[Dissertation]

Amjadi, Houman ; Sessler, Gerhard M. ; Arkhipov, V. I. ; Emelianova, E. V. :
Photoinduced discharge of SiO2 electret films. Part 1: Experimental results.
International Symposium on Electrets <10, 1999, Delphi>: Proceedings. - New York, NY: IEEE, 1999. S. 95-98 IEEE
[Konferenz- oder Workshop-Beitrag], (1999)

Amjadi, Houman :
Charge storage in double layers of silicon dioxide and silicon nitride.
In: International Symposium on Electrets ISE '96 <9, 1996, Shanghai>: Proceedings. Hrsg.: X. Zhongfu (u.a.) S. 22-27 . IEEE , Piscataway, NJ
[Konferenz- oder Workshop-Beitrag], (1996)

Amjadi, Houman :
Silicon-based inorganic electrets for application in micromachined devices.
In: IEEE Transactions on dielectrics and electrical insulation. 3 (1996), No. 4, S. 494-498
[Artikel], (1996)

Amjadi, Houman :
Thermal pulse investigations at thermally grown silicon dioxide electrets.
In: International Symposium on Electrets ISE '96 <9, 1996, Shanghai>: Proceedings. Hrsg.: X. Zhongfu (u.a.) - Piscataway, NJ: IEEE, 1996. S. 259-264 . IEEE , Piscataway, NJ
[Konferenz- oder Workshop-Beitrag], (1996)

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