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Mechanism of charge decay in UV-irradiated SiO2 electret films

Amjadi, Houman and Sessler, Gerhard M. (1999):
Mechanism of charge decay in UV-irradiated SiO2 electret films.
In: Conference on Electrical Insulation and Dielectric Phenomena <68, 1999, Austin, Texas>: Proceedings. - New York, NY: IEEE, 1999. S. 78-81, New York, NY, IEEE, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 1999
Creators: Amjadi, Houman and Sessler, Gerhard M.
Title: Mechanism of charge decay in UV-irradiated SiO2 electret films
Language: English
Series Name: Conference on Electrical Insulation and Dielectric Phenomena <68, 1999, Austin, Texas>: Proceedings. - New York, NY: IEEE, 1999. S. 78-81
Place of Publication: New York, NY
Publisher: IEEE
Divisions: 18 Department of Electrical Engineering and Information Technology
Date Deposited: 19 Nov 2008 15:59
License: [undefiniert]
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