Rispal, Lorraine and Tschischke, T. and Yang, Hongyu and Schwalke, Udo (2008):
Mass-Production of Passivated CNTFETs: Statistics and Gate-Field Dependence of Hysteresis Effect.
In: ECS Transactions, pp. 65-71, 13, (14), [Online-Edition: http://dx.doi.org/10.1149/1.2998532],
[Article]
Official URL: http://dx.doi.org/10.1149/1.2998532
| Item Type: | Article |
|---|---|
| Erschienen: | 2008 |
| Creators: | Rispal, Lorraine and Tschischke, T. and Yang, Hongyu and Schwalke, Udo |
| Title: | Mass-Production of Passivated CNTFETs: Statistics and Gate-Field Dependence of Hysteresis Effect |
| Language: | English |
| Journal or Publication Title: | ECS Transactions |
| Volume: | 13 |
| Number: | 14 |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics |
| Event Title: | 213th Meeting of The Electrochemical Society (ECS) |
| Event Location: | Phoenix, AZ, USA |
| Event Dates: | 18.-23.05.2008 |
| Date Deposited: | 01 Jul 2011 08:20 |
| Official URL: | http://dx.doi.org/10.1149/1.2998532 |
| Export: | |
| Suche nach Titel in: | TUfind oder in Google |
Optionen (nur für Redakteure)
 |
View Item |
Drucken
Impressum