Rispal, Lorraine and Tschischke, T. and Yang, Hongyu and Schwalke, Udo (2008):
Mass-Production of Passivated CNTFETs: Statistics and Gate-Field Dependence of Hysteresis Effect.
In: ECS Transactions, 13 (14), pp. 65-71. [Article]
Official URL: http://dx.doi.org/10.1149/1.2998532
Item Type: | Article |
---|---|
Erschienen: | 2008 |
Creators: | Rispal, Lorraine and Tschischke, T. and Yang, Hongyu and Schwalke, Udo |
Title: | Mass-Production of Passivated CNTFETs: Statistics and Gate-Field Dependence of Hysteresis Effect |
Language: | English |
Journal or Publication Title: | ECS Transactions |
Journal volume: | 13 |
Number: | 14 |
Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics |
Event Title: | 213th Meeting of The Electrochemical Society (ECS) |
Event Location: | Phoenix, AZ, USA |
Event Dates: | 18.-23.05.2008 |
Date Deposited: | 01 Jul 2011 08:20 |
Official URL: | http://dx.doi.org/10.1149/1.2998532 |
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