Rispal, Lorraine ; Tschischke, T. ; Yang, Hongyu ; Schwalke, Udo (2008):
Mass-Production of Passivated CNTFETs: Statistics and Gate-Field Dependence of Hysteresis Effect.
In: ECS Transactions, 13 (14), pp. 65-71. [Article]
URL / URN: http://dx.doi.org/10.1149/1.2998532
| Item Type: | Article |
|---|---|
| Erschienen: | 2008 |
| Creators: | Rispal, Lorraine ; Tschischke, T. ; Yang, Hongyu ; Schwalke, Udo |
| Title: | Mass-Production of Passivated CNTFETs: Statistics and Gate-Field Dependence of Hysteresis Effect |
| Language: | English |
| Journal or Publication Title: | ECS Transactions |
| Journal Volume: | 13 |
| Issue Number: | 14 |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics |
| Event Title: | 213th Meeting of The Electrochemical Society (ECS) |
| Event Location: | Phoenix, AZ, USA |
| Event Dates: | 18.-23.05.2008 |
| Date Deposited: | 01 Jul 2011 08:20 |
| URL / URN: | http://dx.doi.org/10.1149/1.2998532 |
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