TU Darmstadt / ULB / TUbiblio

Structural and Electrical Characterization of Carbon Nanotube Field-Effect Transistors Fabricated by Novel Self-aligned Growth Method

Rispal, Lorraine and Schwalke, Udo (2008):
Structural and Electrical Characterization of Carbon Nanotube Field-Effect Transistors Fabricated by Novel Self-aligned Growth Method.
In: 3rd International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS), [Online-Edition: http://dx.doi.org/10.1109/DTIS.2008.4540244],
[Article]

Item Type: Article
Erschienen: 2008
Creators: Rispal, Lorraine and Schwalke, Udo
Title: Structural and Electrical Characterization of Carbon Nanotube Field-Effect Transistors Fabricated by Novel Self-aligned Growth Method
Language: English
Journal or Publication Title: 3rd International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS)
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics
Event Title: 3rd International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS)
Event Location: Tozeur, Tunesien
Event Dates: 25.-28.03.2008
Date Deposited: 29 Jun 2011 10:43
Official URL: http://dx.doi.org/10.1109/DTIS.2008.4540244
Export:
Suche nach Titel in: TUfind oder in Google

Optionen (nur für Redakteure)

View Item View Item