Rispal, Lorraine and Schwalke, Udo (2008):
Structural and Electrical Characterization of Carbon Nanotube Field-Effect Transistors Fabricated by Novel Self-aligned Growth Method.
In: 3rd International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS), [Online-Edition: http://dx.doi.org/10.1109/DTIS.2008.4540244],
[Article]
Official URL: http://dx.doi.org/10.1109/DTIS.2008.4540244
| Item Type: | Article |
|---|---|
| Erschienen: | 2008 |
| Creators: | Rispal, Lorraine and Schwalke, Udo |
| Title: | Structural and Electrical Characterization of Carbon Nanotube Field-Effect Transistors Fabricated by Novel Self-aligned Growth Method |
| Language: | English |
| Journal or Publication Title: | 3rd International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS) |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics |
| Event Title: | 3rd International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS) |
| Event Location: | Tozeur, Tunesien |
| Event Dates: | 25.-28.03.2008 |
| Date Deposited: | 29 Jun 2011 10:43 |
| Official URL: | http://dx.doi.org/10.1109/DTIS.2008.4540244 |
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