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Polymethyl Methacrylate Passivation of Carbon Nanotube Field-Effect Transistors: Novel Self-aligned Process and Influence on Device Transfer Characteristic Hysteresis

Rispal, Lorraine and Tschischke, T. and Yang, Hongyu and Schwalke, Udo (2008):
Polymethyl Methacrylate Passivation of Carbon Nanotube Field-Effect Transistors: Novel Self-aligned Process and Influence on Device Transfer Characteristic Hysteresis.
In: Japanese Journal of Applied Physics, pp. 3287-3291, 47, (4), [Online-Edition: http://dx.doi.org/10.1143/JJAP.47.3287],
[Article]

Item Type: Article
Erschienen: 2008
Creators: Rispal, Lorraine and Tschischke, T. and Yang, Hongyu and Schwalke, Udo
Title: Polymethyl Methacrylate Passivation of Carbon Nanotube Field-Effect Transistors: Novel Self-aligned Process and Influence on Device Transfer Characteristic Hysteresis
Language: English
Journal or Publication Title: Japanese Journal of Applied Physics
Volume: 47
Number: 4
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics
Date Deposited: 29 Jun 2011 10:37
Official URL: http://dx.doi.org/10.1143/JJAP.47.3287
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