Schwalke, Udo and Rispal, Lorraine (2010):
Non-Volatile Memory Effect in Carbon Nanotube Field-Effect Transistors: Charge Trapping in AlxOy High-k Dielectrics Made from Sacrificial Metal Catalyst.
In: 41st IEEE Semiconductor Interface Specialists Conference (SISC), San Diego, CA, USA, 02.-04.12.2010, [Conference or Workshop Item]
| Item Type: | Conference or Workshop Item |
|---|---|
| Erschienen: | 2010 |
| Creators: | Schwalke, Udo and Rispal, Lorraine |
| Title: | Non-Volatile Memory Effect in Carbon Nanotube Field-Effect Transistors: Charge Trapping in AlxOy High-k Dielectrics Made from Sacrificial Metal Catalyst |
| Language: | English |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics |
| Event Title: | 41st IEEE Semiconductor Interface Specialists Conference (SISC) |
| Event Location: | San Diego, CA, USA |
| Event Dates: | 02.-04.12.2010 |
| Date Deposited: | 28 Jun 2011 09:36 |
| Export: |
Optionen (nur für Redakteure)
 |
View Item |
Drucken
Impressum