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English

Edelmann, F. ; Hahn, H. ; Seifried, S. ; Alof, S. ; Hoche, H. ; Balogh, Adam G. ; Werner, P. ; Zakrzewska, K. ; Radecka, M. ; Pasierb, P. ; Chack, A. ; Mikhelashvili, V. ; Eisenstein, G. (2000):
Structural evolution of SnO2-TiO2 nanocrystalline films for gas sensors.
In: Materials Science and Engineering B, 69, pp. 386-391. [Article]

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