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Edelmann, F. and Hahn, H. and Seifried, S. and Alof, S. and Hoche, H. and Balogh, Adam G. and Werner, P. and Zakrzewska, K. and Radecka, M. and Pasierb, P. and Chack, A. and Mikhelashvili, V. and Eisenstein, G. (2000):
Structural evolution of SnO2-TiO2 nanocrystalline films for gas sensors.
In: Materials Science and Engineering B, pp. 386-391, 69, [Article]

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