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Number of items: 3.

Öksüzoglu, Ramis M. ; Weirich, Th. E. ; Fuess, Hartmut (2003):
Characterization of Co25Ag75 and (Co90Al10)28Ag72 granular films by electron diffraction, high resolution transmission spectroscopic imaging.
In: Journal of electron microscopy, 52, pp. 91-100. [Article]

Hohl, Achim ; Wieder, Thomas ; Aken, Peter A. van ; Weirich, Th. E. ; Denninger, G. ; Vidal, M. ; Oswald, S. ; Deneke, C. ; Mayer, J. ; Fuess, Hartmut (2003):
An interface clusters mixture model for the structure of amorphous silicon monoxide (SiO).
In: Journal of non-crystalline solids, 320 (1-3), pp. 255-280. Elsevier, ISSN 0022-3093, e-ISSN 1873-4812,
DOI: 10.1016/S0022-3093(03)00031-0,
[Article]

Weirich, Th. E. ; Winterer, M. ; Seifried, S. ; Hahn, Horst ; Fuess, Hartmut (2000):
Rietveld analysis of electron powder diffraction data from nanocrystalline anatase TiO2.
In: Ultramicroscopy, 81, pp. 263-270. [Article]

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