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1996
Iida, Tsutomu ; Makita, Yunosuke ; Shima, Takayuki ; Kimura, Shinji ; Horn, Joachim ; Hartnagel, Hans L. ; Uekusa, Shin‐ichiro (1996)
C+-energy-dependent residual ion damage in GaAs: C grown by the low-energy ion-beam doping method.
In: Journal of Applied Physics, 80 (7)
doi: 10.1063/1.363306
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