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Richard, Marie-Ingrid ; Labat, Stéphane ; Dupraz, Maxime ; Carnis, Jérôme ; Gao, Lu ; Texier, Michaël ; Li, Ni ; Wu, Longfei ; Hofmann, Jan P. ; Levi, Mor ; Leake, Steven J. ; Lazarev, Sergey ; Sprung, Michael ; Hensen, Emiel J. M. ; Rabkin, Eugen ; Thomas, Olivier (2023)
Anomalous glide plane in platinum nano- and microcrystals.
In: ACS Nano, 17 (6)
doi: 10.1021/acsnano.3c01306
Artikel, Bibliographie
Dupraz, Maxime ; Li, Ni ; Carnis, Jérôme ; Wu, Longfei ; Labat, Stéphane ; Chatelier, Corentin ; van de Poll, Rim ; Hofmann, Jan P. ; Almog, Ehud ; Leake, Steven J. ; Watier, Yves ; Lazarev, Sergey ; Westermeier, Fabian ; Sprung, Michael ; Hensen, Emiel J. M. ; Thomas, Olivier ; Rabkin, Eugen ; Richard, Marie-Ingrid (2022)
Imaging the facet surface strain state of supported multi-faceted Pt nanoparticles during reaction.
In: Nature Communications, 13 (1)
doi: 10.1038/s41467-022-30592-1
Artikel, Bibliographie
Li, Ni ; Dupraz, Maxime ; Wu, Longfei ; Leake, Steven J. ; Resta, Andrea ; Carnis, Jérôme ; Labat, Stéphane ; Almog, Ehud ; Rabkin, Eugen ; Favre-Nicolin, Vincent ; Picca, Frédéric-Emmanuel ; Berenguer, Felisa ; Poll, Rim van de ; Hofmann, Jan P. ; Vlad, Alina ; Thomas, Olivier ; Garreau, Yves ; Coati, Alessandro ; Richard, Marie-Ingrid (2020)
Continuous scanning for Bragg coherent X-ray imaging.
In: Scientific Reports, 10 (1)
doi: 10.1038/s41598-020-69678-5
Artikel, Bibliographie
Carnis, Jérôme ; Gao, Lu ; Labat, Stéphane ; Kim, Young Yong ; Hofmann, Jan P. ; Leake, Steven J. ; Schülli, Tobias U. ; Hensen, Emiel J. M. ; Thomas, Olivier ; Richard, Marie-Ingrid (2019)
Towards a quantitative determination of strain in Bragg Coherent X-ray Diffraction Imaging: artefacts and sign convention in reconstructions.
In: Scientific Reports, 9 (1)
doi: 10.1038/s41598-019-53774-2
Artikel, Bibliographie
Richard, Marie-Ingrid ; Fernández, Sara ; Eymery, Joël ; Hofmann, Jan P. ; Gao, Lu ; Carnis, Jérôme ; Labat, Stéphane ; Favre-Nicolin, Vincent ; Hensen, Emiel J. M. ; Thomas, Olivier ; Schülli, Tobias U. ; Leake, Steven J. (2018)
Crystallographic orientation of facets and planar defects in functional nanostructures elucidated by nano-focused coherent diffractive X-ray imaging.
In: Nanoscale, 10 (10)
doi: 10.1039/C7NR07990G
Artikel, Bibliographie