Richard, Marie-Ingrid ; Fernández, Sara ; Eymery, Joël ; Hofmann, Jan P. ; Gao, Lu ; Carnis, Jérôme ; Labat, Stéphane ; Favre-Nicolin, Vincent ; Hensen, Emiel J. M. ; Thomas, Olivier ; Schülli, Tobias U. ; Leake, Steven J. (2018)
Crystallographic orientation of facets and planar defects in functional nanostructures elucidated by nano-focused coherent diffractive X-ray imaging.
In: Nanoscale, 10 (10)
doi: 10.1039/C7NR07990G
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