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Kaiser, G. ; Meyer, A. ; Friess, M. ; Riedel, R. ; Harris, M. ; Jacob, E. ; Tölg, G. (1995)
Critical comparison of ICP-OES, XRF, and fluorine volatilization-FTIR spectrometry for the reliable determination of the silicon main constituent in ceramic materials.
In: Fresenius' journal of analystical chemistry, 352 (3)
doi: 10.1007/BF00322228
Article, Bibliographie
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