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Jump to: 2007
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Gesswein, H. and Paul, F. and Binder, J. R. and Giere, A. (2007):
High resolution X-ray diffraction study of the microstructure of undoped and doped Ba0.6Sr0.4TiO3 thick films.
Karlsruhe, 6th ANKA Users Meeting, [Conference or Workshop Item]

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