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High resolution X-ray diffraction study of the microstructure of undoped and doped Ba0.6Sr0.4TiO3 thick films

Gesswein, H. and Paul, F. and Binder, J. R. and Giere, A. (2007):
High resolution X-ray diffraction study of the microstructure of undoped and doped Ba0.6Sr0.4TiO3 thick films.
Karlsruhe, In: 6th ANKA Users Meeting, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 2007
Creators: Gesswein, H. and Paul, F. and Binder, J. R. and Giere, A.
Title: High resolution X-ray diffraction study of the microstructure of undoped and doped Ba0.6Sr0.4TiO3 thick films
Language: English
Place of Publication: Karlsruhe
Divisions: 18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics > Microwave Engineering
18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics
Event Title: 6th ANKA Users Meeting
Date Deposited: 27 Jan 2012 15:19
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