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Tone, Robert ; Bornemann, Nils ; Mechau, Norman ; Al Helwi, Mustapha ; Sauer, Hans Martin ; Dörsam, Edgar (2012)
Impedance Spectroscopy as a Tool for the Detection of Mixed Layers in Solution Processed Semiconductors.
Large-area, Organic & Printed Electronics Convention (LOPE-C). Munich, Germany (June 19-21 2012)
Conference or Workshop Item, Bibliographie

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