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Impedance Spectroscopy as a Tool for the Detection of Mixed Layers in Solution Processed Semiconductors

Tone, Robert and Bornemann, Nils and Mechau, Norman and Al Helwi, Mustapha and Sauer, Hans Martin and Dörsam, Edgar (2012):
Impedance Spectroscopy as a Tool for the Detection of Mixed Layers in Solution Processed Semiconductors.
In: Large-area, Organic & Printed Electronics Convention (LOPE-C), Munich, Germany, June 19-21, pp. 419-422, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 2012
Creators: Tone, Robert and Bornemann, Nils and Mechau, Norman and Al Helwi, Mustapha and Sauer, Hans Martin and Dörsam, Edgar
Title: Impedance Spectroscopy as a Tool for the Detection of Mixed Layers in Solution Processed Semiconductors
Language: English
Divisions: 16 Department of Mechanical Engineering > Institute of Printing Science and Technology (IDD)
16 Department of Mechanical Engineering
Event Title: Large-area, Organic & Printed Electronics Convention (LOPE-C)
Event Location: Munich, Germany
Event Dates: June 19-21
Date Deposited: 05 Jul 2012 11:34
Identification Number: ISBN 978-3-00-034957-7
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