Tone, Robert and Bornemann, Nils and Mechau, Norman and Al Helwi, Mustapha and Sauer, Hans Martin and Dörsam, Edgar (2012):
Impedance Spectroscopy as a Tool for the Detection of Mixed Layers in Solution Processed Semiconductors.
In: Large-area, Organic & Printed Electronics Convention (LOPE-C), Munich, Germany, June 19-21, pp. 419-422, [Conference or Workshop Item]
| Item Type: | Conference or Workshop Item |
|---|---|
| Erschienen: | 2012 |
| Creators: | Tone, Robert and Bornemann, Nils and Mechau, Norman and Al Helwi, Mustapha and Sauer, Hans Martin and Dörsam, Edgar |
| Title: | Impedance Spectroscopy as a Tool for the Detection of Mixed Layers in Solution Processed Semiconductors |
| Language: | English |
| Divisions: | 16 Department of Mechanical Engineering > Institute of Printing Science and Technology (IDD) 16 Department of Mechanical Engineering |
| Event Title: | Large-area, Organic & Printed Electronics Convention (LOPE-C) |
| Event Location: | Munich, Germany |
| Event Dates: | June 19-21 |
| Date Deposited: | 05 Jul 2012 11:34 |
| Identification Number: | ISBN 978-3-00-034957-7 |
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