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Tone, Robert and Bornemann, Nils and Mechau, Norman and Al Helwi, Mustapha and Sauer, Hans Martin and Dörsam, Edgar :
Impedance Spectroscopy as a Tool for the Detection of Mixed Layers in Solution Processed Semiconductors.
In: Large-area, Organic & Printed Electronics Convention (LOPE-C), June 19-21, Munich, Germany.
[Conference or Workshop Item] , (2012)

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