Vogt, Alexander ; Brandt, ; Sigurdardottir, A. ; Schüssler, ; Pena, ; Simon, ; Hartnagel, H. L. ; Rodewald, ; Roesner, (1997):
Characterisation of degradation mechanisms in resonant tunnelling diodes.
In: Microelectronics and reliability, 37 (10-11), pp. 1691-1694. Elsevier, ISSN 1872-941X,
[Article]
| Item Type: | Article |
|---|---|
| Erschienen: | 1997 |
| Creators: | Vogt, Alexander ; Brandt, ; Sigurdardottir, A. ; Schüssler, ; Pena, ; Simon, ; Hartnagel, H. L. ; Rodewald, ; Roesner, |
| Title: | Characterisation of degradation mechanisms in resonant tunnelling diodes |
| Language: | English |
| Journal or Publication Title: | Microelectronics and reliability |
| Volume of the journal: | 37 |
| Issue Number: | 10-11 |
| Publisher: | Elsevier |
| Divisions: | 11 Department of Materials and Earth Sciences 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Microwave Electronics 11 Department of Materials and Earth Sciences > Department of Earth Sciences (1999 merged into Department of Materials and Earth Sciences) |
| Date Deposited: | 19 Nov 2008 16:04 |
| License: | [undefiniert] |
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