Horn, Joachim ; Pavlidis, Dimitris ; Park, Yongjo ; Hartnagel, Hans L. (1996)
Scanning tunneling microscopy characterization of MOCVD grown GaN.
In: Materials Science and Engineering: B, 44 (1/3)
doi: 10.1016/S0921-5107(96)01791-6
Article, Bibliographie
| Item Type: | Article |
|---|---|
| Erschienen: | 1996 |
| Creators: | Horn, Joachim ; Pavlidis, Dimitris ; Park, Yongjo ; Hartnagel, Hans L. |
| Type of entry: | Bibliographie |
| Title: | Scanning tunneling microscopy characterization of MOCVD grown GaN |
| Language: | English |
| Date: | 1996 |
| Publisher: | Elsevier |
| Journal or Publication Title: | Materials Science and Engineering: B |
| Volume of the journal: | 44 |
| Issue Number: | 1/3 |
| DOI: | 10.1016/S0921-5107(96)01791-6 |
| Additional Information: | 3. International Workshop on Expert Evaluation and Control of Compound Semiconductor Materials and Technologies (EXMATEC), Breisgau, 1996 |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Microwave Electronics |
| Date Deposited: | 19 Nov 2008 16:04 |
| Last Modified: | 08 May 2024 09:13 |
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