| Item Type: |
Conference or Workshop Item
|
| Erschienen: |
1999 |
| Creators: |
Gastel, Michael ; Flege, Stefan ; Breuer, U. ; Ortner, H. M. |
| Type of entry: |
Bibliographie |
| Title: |
Generalisation of the 'correlation plot' method for standard-free quantification of SIMS and SNMS measurements for samples containing three or more elements |
| Language: |
English |
| Date: |
1999 |
| Place of Publication: |
Amsterdam |
| Publisher: |
Elsevier |
| Series: |
International Conference on Secondary Ion Mass Spectrometry <11, 1999, Brussels>: Proceedings. Hrsg.: A. Benninghoven (u.a.). - Amsterdam: Elsevier, 2000. S. 405-408 |
| Divisions: |
11 Department of Materials and Earth Sciences |
| Date Deposited: |
19 Nov 2008 16:04 |
| Last Modified: |
05 Mar 2013 08:38 |
| PPN: |
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| Export: |
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