Gastel, Michael ; Flege, Stefan ; Breuer, U. ; Ortner, H. M. (1999):
Generalisation of the 'correlation plot' method for standard-free quantification of SIMS and SNMS measurements for samples containing three or more elements.
In: International Conference on Secondary Ion Mass Spectrometry <11, 1999, Brussels>: Proceedings. Hrsg.: A. Benninghoven (u.a.). - Amsterdam: Elsevier, 2000. S. 405-408, Amsterdam, Elsevier, [Conference or Workshop Item]
| Item Type: | Conference or Workshop Item |
|---|---|
| Erschienen: | 1999 |
| Creators: | Gastel, Michael ; Flege, Stefan ; Breuer, U. ; Ortner, H. M. |
| Title: | Generalisation of the 'correlation plot' method for standard-free quantification of SIMS and SNMS measurements for samples containing three or more elements |
| Language: | English |
| Series: | International Conference on Secondary Ion Mass Spectrometry <11, 1999, Brussels>: Proceedings. Hrsg.: A. Benninghoven (u.a.). - Amsterdam: Elsevier, 2000. S. 405-408 |
| Place of Publication: | Amsterdam |
| Publisher: | Elsevier |
| Divisions: | 11 Department of Materials and Earth Sciences |
| Date Deposited: | 19 Nov 2008 16:04 |
| License: | [undefiniert] |
| Export: | |
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