Keyn, Martin ; Schwalke, Udo (2013)
Multi-CNTFETs for Power Device Applications: Investigation of CCVD Grown CNTs by Means of Atomic Force Microscopy.
In: 8th International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS)
Article, Bibliographie
URL / URN: http://dx.doi.org/10.1109/DTIS.2013.6527767
Item Type: | Article |
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Erschienen: | 2013 |
Creators: | Keyn, Martin ; Schwalke, Udo |
Type of entry: | Bibliographie |
Title: | Multi-CNTFETs for Power Device Applications: Investigation of CCVD Grown CNTs by Means of Atomic Force Microscopy |
Language: | English |
Date: | 28 March 2013 |
Journal or Publication Title: | 8th International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS) |
URL / URN: | http://dx.doi.org/10.1109/DTIS.2013.6527767 |
Additional Information: | 8th International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS), Abu Dhabi, United Arab Emirates, 26.-28.03.2013 |
Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics |
Date Deposited: | 08 Apr 2013 12:52 |
Last Modified: | 08 May 2024 08:52 |
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