TU Darmstadt / ULB / TUbiblio

Multi-CNTFETs for Power Device Applications: Investigation of CCVD Grown CNTs by Means of Atomic Force Microscopy

Keyn, Martin ; Schwalke, Udo (2013)
Multi-CNTFETs for Power Device Applications: Investigation of CCVD Grown CNTs by Means of Atomic Force Microscopy.
In: 8th International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS)
Article, Bibliographie

Item Type: Article
Erschienen: 2013
Creators: Keyn, Martin ; Schwalke, Udo
Type of entry: Bibliographie
Title: Multi-CNTFETs for Power Device Applications: Investigation of CCVD Grown CNTs by Means of Atomic Force Microscopy
Language: English
Date: 28 March 2013
Journal or Publication Title: 8th International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS)
Event Title: 8th International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS)
Event Location: Abu Dhabi, United Arab Emirates
Event Dates: 26.-28.03.2013
URL / URN: http://dx.doi.org/10.1109/DTIS.2013.6527767
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics
Date Deposited: 08 Apr 2013 12:52
Last Modified: 10 Oct 2013 05:22
PPN:
Export:
Suche nach Titel in: TUfind oder in Google
Send an inquiry Send an inquiry

Options (only for editors)
Show editorial Details Show editorial Details