Keyn, Martin ; Schwalke, Udo (2013):
Multi-CNTFETs for Power Device Applications: Investigation of CCVD Grown CNTs by Means of Atomic Force Microscopy.
In: 8th International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS), [Article]
URL / URN: http://dx.doi.org/10.1109/DTIS.2013.6527767
| Item Type: | Article |
|---|---|
| Erschienen: | 2013 |
| Creators: | Keyn, Martin ; Schwalke, Udo |
| Title: | Multi-CNTFETs for Power Device Applications: Investigation of CCVD Grown CNTs by Means of Atomic Force Microscopy |
| Language: | English |
| Journal or Publication Title: | 8th International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS) |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics |
| Event Title: | 8th International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS) |
| Event Location: | Abu Dhabi, United Arab Emirates |
| Event Dates: | 26.-28.03.2013 |
| Date Deposited: | 08 Apr 2013 12:52 |
| URL / URN: | http://dx.doi.org/10.1109/DTIS.2013.6527767 |
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