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Generalization of the „Correlation Plot“-Method for Standard-Free Quantification of SIMS- and SNMS-Measurements for Samples Containing Three or More Elements

Gastel, Michael ; Flege, Stefan ; Breuer, U. ; Ortner, H. M. (2000)
Generalization of the „Correlation Plot“-Method for Standard-Free Quantification of SIMS- and SNMS-Measurements for Samples Containing Three or More Elements.
In: Proceedings of the 12th International Conference on Secondary Ion Mass Spectrometry, Brussels, Sept. 1999, A. Benninghoven, P. Bertrand, H.-N. Migeon, H.W. Werner, eds
Article, Bibliographie

Item Type: Article
Erschienen: 2000
Creators: Gastel, Michael ; Flege, Stefan ; Breuer, U. ; Ortner, H. M.
Type of entry: Bibliographie
Title: Generalization of the „Correlation Plot“-Method for Standard-Free Quantification of SIMS- and SNMS-Measurements for Samples Containing Three or More Elements
Language: English
Date: 2000
Publisher: Elsevier
Journal or Publication Title: Proceedings of the 12th International Conference on Secondary Ion Mass Spectrometry, Brussels, Sept. 1999, A. Benninghoven, P. Bertrand, H.-N. Migeon, H.W. Werner, eds
Divisions: 11 Department of Materials and Earth Sciences > Material Science > Material Analytics
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences
Date Deposited: 25 Jun 2012 11:52
Last Modified: 05 Mar 2013 10:01
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