TU Darmstadt / ULB / TUbiblio

High resolution surface characterization using STM light emission techniques

Horn, Joachim ; Marx, N. ; Weiss, B. L. ; Hartnagel, H. L. ; Stehle, M. ; Bischoff, M. ; Pagnia, H. (1995)
High resolution surface characterization using STM light emission techniques.
In: Passivation of metals and semiconductors
Book Section, Bibliographie

Item Type: Book Section
Erschienen: 1995
Creators: Horn, Joachim ; Marx, N. ; Weiss, B. L. ; Hartnagel, H. L. ; Stehle, M. ; Bischoff, M. ; Pagnia, H.
Type of entry: Bibliographie
Title: High resolution surface characterization using STM light emission techniques
Language: English
Date: 1995
Place of Publication: Aedermannsdorf
Publisher: Trans Tech Publ
Book Title: Passivation of metals and semiconductors
Series Volume: 185-18
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Microwave Electronics
Date Deposited: 19 Nov 2008 15:58
Last Modified: 23 Apr 2024 11:56
PPN:
Export:
Suche nach Titel in: TUfind oder in Google
Send an inquiry Send an inquiry

Options (only for editors)
Show editorial Details Show editorial Details