Horn, Joachim ; Marx, ; Weiss, ; Hartnagel, ; Stehle, ; Bischoff, ; Pagnia, (1995):
High resolution surface characterization using STM light emission techniques.
185-18, In: Passivation of metals and semiconductors. Hrsg.: K.E. Heusler. S. 145-154, Aedermannsdorf: Trans Tech Publ., 1995, Aedermannsdorf, Trans Tech Publ, [Book Section]
| Item Type: | Book Section |
|---|---|
| Erschienen: | 1995 |
| Creators: | Horn, Joachim ; Marx, ; Weiss, ; Hartnagel, ; Stehle, ; Bischoff, ; Pagnia, |
| Title: | High resolution surface characterization using STM light emission techniques |
| Language: | German |
| Book Title: | Passivation of metals and semiconductors. Hrsg.: K.E. Heusler. S. 145-154 |
| Series Volume: | 185-18 |
| Place of Publication: | Aedermannsdorf |
| Publisher: | Trans Tech Publ |
| Edition: | Aedermannsdorf: Trans Tech Publ., 1995 |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Microwave Electronics |
| Date Deposited: | 19 Nov 2008 15:58 |
| License: | [undefiniert] |
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