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The use of analytical peak profile functions to fit diffraction data of planar faulted layer crystals

Estevez-Rams, E. ; Penton, A. ; Martinez-Garcia, J. ; Fuess, Hartmut (2005)
The use of analytical peak profile functions to fit diffraction data of planar faulted layer crystals.
In: Crystal research and technology, 40
Article, Bibliographie

Item Type: Article
Erschienen: 2005
Creators: Estevez-Rams, E. ; Penton, A. ; Martinez-Garcia, J. ; Fuess, Hartmut
Type of entry: Bibliographie
Title: The use of analytical peak profile functions to fit diffraction data of planar faulted layer crystals
Language: English
Date: 1 January 2005
Journal or Publication Title: Crystal research and technology
Volume of the journal: 40
Divisions: 11 Department of Materials and Earth Sciences
Date Deposited: 20 Nov 2008 08:24
Last Modified: 20 Feb 2020 13:24
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