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Fermi level dependent defect formation at Cu(In,Ga)Se2 interfaces

Klein, Andreas ; Fritsche, J. ; Jaegermann, W. ; Schön, J. H. ; Kloc, C. ; Bucher, E. (2000)
Fermi level dependent defect formation at Cu(In,Ga)Se2 interfaces.
In: Applied Surface Science, 166 (1-4)
doi: 10.1016/S0169-4332(00)00484-0
Article, Bibliographie

Item Type: Article
Erschienen: 2000
Creators: Klein, Andreas ; Fritsche, J. ; Jaegermann, W. ; Schön, J. H. ; Kloc, C. ; Bucher, E.
Type of entry: Bibliographie
Title: Fermi level dependent defect formation at Cu(In,Ga)Se2 interfaces
Language: German
Date: 9 October 2000
Journal or Publication Title: Applied Surface Science
Volume of the journal: 166
Issue Number: 1-4
DOI: 10.1016/S0169-4332(00)00484-0
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Surface Science
Date Deposited: 19 Nov 2008 15:57
Last Modified: 20 Feb 2020 13:27
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