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Role of oxygen defects in forming conductive filaments in Y2O3-based analog RRAM devices as revealed by fluctuation spectroscopy

Piros, Eszter ; Lonsky, Martin ; Petzold, Martin ; Zintler, Alexander ; Sharath, S.U. ; Vogel, Tobias ; Kaiser, Nico ; Eilhardt, Robert ; Molina-Luna, Leopoldo ; Wenger, Christian ; Müller, Jens ; Alff, Lambert (2020)
Role of oxygen defects in forming conductive filaments in Y2O3-based analog RRAM devices as revealed by fluctuation spectroscopy.
In: Physical Review Applied
Article, Bibliographie

Item Type: Article
Erschienen: 2020
Creators: Piros, Eszter ; Lonsky, Martin ; Petzold, Martin ; Zintler, Alexander ; Sharath, S.U. ; Vogel, Tobias ; Kaiser, Nico ; Eilhardt, Robert ; Molina-Luna, Leopoldo ; Wenger, Christian ; Müller, Jens ; Alff, Lambert
Type of entry: Bibliographie
Title: Role of oxygen defects in forming conductive filaments in Y2O3-based analog RRAM devices as revealed by fluctuation spectroscopy
Language: English
Date: 8 May 2020
Publisher: APS Publishing
Journal or Publication Title: Physical Review Applied
URL / URN: https://journals.aps.org/prapplied/accepted/86072YacA411cc69...
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Advanced Electron Microscopy (aem)
11 Department of Materials and Earth Sciences > Material Science > Advanced Thin Film Technology
Date Deposited: 20 May 2020 07:03
Last Modified: 20 May 2020 07:03
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