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Number of items: 5.

Decker, Norman and Dreyer, Boris and Gottschling, Philip and Hochberger, Christian and Lange, Alexander and Leucker, Martin and Scheffel, Torben and Wegener, Simon and Weiss, Alexander (2018):
Online analysis of debug trace data for embedded systems.
In: Design, Automation & Test in Europe Conference & Exhibition (DATE), 2018, DOI: 10.23919/DATE.2018.8342124,
[Online-Edition: https://ieeexplore.ieee.org/document/8342124/],
[Conference or Workshop Item]

Decker, Norman and Gottschling, Philip and Hochberger, Christian and Luecker, Martin and Scheffel, Torben and Schmitz, Malte and Weiss, Alexander (2017):
Rapidly Adjustable Non-intrusive Online Monitoring for Multi-core Systems.
In: SBMF 2017: Brazilian Symposium on Formal Methods, DOI: 10.1007/978-3-319-70848-5_12,
[Online-Edition: https://link.springer.com/chapter/10.1007%2F978-3-319-70848-...],
[Conference or Workshop Item]

Dreyer, Boris and Hochberger, Christian and Lange, Alexander and Wegener, Simon and Weiss, Alexander (2016):
Continuous Non-Intrusive Hybrid WCET Estimation Using Waypoint Graphs.
In: 16th International Workshop on Worst-Case Execution Time Analysis (WCET 2016), [Online-Edition: http://drops.dagstuhl.de/opus/volltexte/2016/6897/],
[Conference or Workshop Item]

Dreyer, Boris and Hochberger, Christian and Wegener, Simon and Weiss, Alexander
Cazorla, Francisco J. (ed.) (2015):
Precise Continuous Non-Intrusive Measurement-Based Execution Time Estimation.
Dagstuhl, Germany, Schloss Dagstuhl--Leibniz-Zentrum fuer Informatik, In: 15th International Workshop on Worst-Case Execution Time Analysis (WCET 2015), Dagstuhl, Germany, In: OpenAccess Series in Informatics (OASIcs), 47, ISSN 2190-6807,
ISBN 978-3-939897-95-8,
[Online-Edition: http://drops.dagstuhl.de/opus/volltexte/2015/5255],
[Conference or Workshop Item]

Backasch, Rico and Hochberger, Christian and Weiss, Alexander and Leucker, Martin and Lasslop, Richard (2013):
Runtime verification for multicore SoC with high-quality trace data.
In: ACM Transactions on Design Automation of Electronic Systems, pp. 1-26, 18, (2), ISSN 10844309,
[Online-Edition: http://dx.doi.org/10.1145/2442087.2442089],
[Article]

This list was generated on Sat Jun 15 01:38:35 2019 CEST.