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Online analysis of debug trace data for embedded systems

Decker, Norman and Dreyer, Boris and Gottschling, Philip and Hochberger, Christian and Lange, Alexander and Leucker, Martin and Scheffel, Torben and Wegener, Simon and Weiss, Alexander (2018):
Online analysis of debug trace data for embedded systems.
In: Design, Automation & Test in Europe Conference & Exhibition (DATE), 2018, DOI: 10.23919/DATE.2018.8342124, [Online-Edition: https://ieeexplore.ieee.org/document/8342124/],
[Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 2018
Creators: Decker, Norman and Dreyer, Boris and Gottschling, Philip and Hochberger, Christian and Lange, Alexander and Leucker, Martin and Scheffel, Torben and Wegener, Simon and Weiss, Alexander
Title: Online analysis of debug trace data for embedded systems
Language: English
Title of Book: Design, Automation & Test in Europe Conference & Exhibition (DATE), 2018
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute of Computer Engineering
18 Department of Electrical Engineering and Information Technology > Institute of Computer Engineering > Computer Systems Group
Date Deposited: 30 May 2018 09:04
DOI: 10.23919/DATE.2018.8342124
Official URL: https://ieeexplore.ieee.org/document/8342124/
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