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Wahl, Claudia (2002):
Charakterisierung innerer Grenzflächen in mikrokristallinem SiO2 mit Transmissionselektronenmikroskopie.
Darmstadt, Technische Universität, TU Darmstadt, [Online-Edition: urn:nbn:de:tuda-tuprints-1978],
[Ph.D. Thesis]

Wahl, Claudia (2002):
Charakterisierung innerer Grenzflächen in mikrokristallinem SiO 2 mit Transmissionselektronenmikroskopie.
Darmstadt, Techn. Univ., TU Darmstadt, [Ph.D. Thesis]

Wahl, Claudia and Miehe, Gerhard and Fuess, Hartmut (2002):
TEM characterization and interpretation of fabric and structural degree of order in microcrystalline SiO2 phases.
In: Contributions in mineralogy and petrology, 143pp. 360-365, [Article]

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