Stadermann, Frank J. and Ortner, (1997):
SIMS 3-D imaging of particles and other samples with a heterogeneous matrix.
In: International Conference on Secondary Ion Mass Spectrometry <10, 1997>: Proceedings. Hrsg.: A. Benninghoven (u.a.) S. 214-234, Chichester: Wiley, 1997,
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Möller, Andreas and Weinbruch, Stephan and Stadermann, Frank J. and Ortner, Hugo M. and Neubeck, Klaus and Balogh, Adam G. and Hahn, Horst (1995):
Accuracy of film thickness determination in electron probe microanalysis.
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