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Accuracy of film thickness determination in electron probe microanalysis

Möller, Andreas and Weinbruch, Stephan and Stadermann, Frank J. and Ortner, Hugo M. and Neubeck, Klaus and Balogh, Adam G. and Hahn, Horst (1995):
Accuracy of film thickness determination in electron probe microanalysis.
In: Microchimica acta, Springer-Verlag, pp. 41-47, 119, ISSN 0026-3672, [Article]

Item Type: Article
Erschienen: 1995
Creators: Möller, Andreas and Weinbruch, Stephan and Stadermann, Frank J. and Ortner, Hugo M. and Neubeck, Klaus and Balogh, Adam G. and Hahn, Horst
Title: Accuracy of film thickness determination in electron probe microanalysis
Language: English
Journal or Publication Title: Microchimica acta
Volume: 119
Publisher: Springer-Verlag
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Earth Science
11 Department of Materials and Earth Sciences > Earth Science > Environmental Mineralogy
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Material Analytics
11 Department of Materials and Earth Sciences > Fachbereich Materialwissenschaft (1999 aufgegangen in 11 Fachbereich Material- und Geowissenschaften)
Date Deposited: 19 Nov 2008 15:56
License: [undefiniert]
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