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Accuracy of film thickness determination in electron probe microanalysis

Möller, Andreas ; Weinbruch, Stephan ; Stadermann, Frank J. ; Ortner, Hugo M. ; Neubeck, Klaus ; Balogh, Adam G. ; Hahn, Horst (1995):
Accuracy of film thickness determination in electron probe microanalysis.
In: Microchimica acta, 119, pp. 41-47. Springer-Verlag, ISSN 0026-3672,
[Article]

Item Type: Article
Erschienen: 1995
Creators: Möller, Andreas ; Weinbruch, Stephan ; Stadermann, Frank J. ; Ortner, Hugo M. ; Neubeck, Klaus ; Balogh, Adam G. ; Hahn, Horst
Title: Accuracy of film thickness determination in electron probe microanalysis
Language: English
Journal or Publication Title: Microchimica acta
Journal Volume: 119
Publisher: Springer-Verlag
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Earth Science
11 Department of Materials and Earth Sciences > Earth Science > Environmental Mineralogy
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Material Analytics
11 Department of Materials and Earth Sciences > Department of Earth Sciences (1999 merged into Department of Materials and Earth Sciences)
Date Deposited: 19 Nov 2008 15:56
License: [undefiniert]
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