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Number of items: 3.

Ricohermoso, Emmanuel ; Klug, Florian ; Schlaak, Helmut ; Riedel, Ralf ; Ionescu, Emanuel (2022):
Microstrain-range giant piezoresistivity of silicon oxycarbide thin films under mechanical cyclic loads.
In: Materials & Design, 213, p. 110323. Elsevier, ISSN 0264-1275, e-ISSN 1873-4197,
DOI: 10.1016/j.matdes.2021.110323,
[Article]

Ricohermoso, Emmanuel ; Klug, Florian ; Schlaak, Helmut ; Riedel, Ralf ; Ionescu, Emanuel (2021):
Compressive thermal stress and microstructure-driven charge carrier transport in silicon oxycarbide thin films.
In: Journal of the European Ceramic Society, 41 (13), pp. 6377-6384. Elsevier, ISSN 0955-2219, e-ISSN 1873-619X,
DOI: 10.1016/j.jeurceramsoc.2021.07.001,
[Article]

Cardoletti, Juliette ; Radetinac, Aldin ; Thiem, Daniel ; Walker, Julian ; Komissinskiy, Philipp ; Xu, Bai-Xiang ; Schlaak, Helmut ; Trolier-McKinstry, Susan ; Alff, Lambert (2019):
Modelling of the vertical deflection of ferroelectric bending tongues loaded at their free end.
In: AIP Advances, 9 (2), American Institute of Physics, ISSN 2158-3226,
DOI: 10.1063/1.5082392,
[Article]

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