Vogt, Alexander ; Brandt, ; Sigurdardottir, A. ; Schüssler, ; Pena, ; Simon, ; Hartnagel, H. L. ; Rodewald, ; Roesner, (1997):
Characterisation of degradation mechanisms in resonant tunnelling diodes.
In: Microelectronics and reliability. 37 (1997), S. 1691-1694, [Article]

Borgarino, M. ; Menozzi, ; Fantini, ; Schüssler, ; Hartnagel, (1995):
High base current ideality factors due to trap-assisted band-to-band tunneling in AlGaAs/GaAs HBTs.
In: Alta frequenza. 7 (1995), No. 5, [Article]