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Number of items: 14.

Brandt, Michael and Krozer, and Schüßler, and Lin, and Simon, and Vogt, and Rodriguez, and Parmeggiani, and Grajal, (1998):
Application of transmission line pulsed (TLP) stress for thermal and reliability characterisation of compound semiconductor devices.
In: Reliability Center of Japan (RCJ) Symposium <1998, Tokyo>: Proceedings, [Conference or Workshop Item]

Krozer, Viktor and Brandt, and Schüßler, and Hartnagel, (1998):
Application of transmission line pulses for reliability characterisation of high temperature devices.
In: HiTEC´98: High -Temperature Electronics Conference <1998, Albuquerque>: Proceedings. S. 138-143, [Conference or Workshop Item]

Vogt, Alexander and Brandt, and Sigurdardottir, A. and Schüßler, and Pena, and Simon, and Hartnagel, H. L. and Rodewald, and Roesner, (1997):
Characterisation of degradation mechanisms in resonant tunneling diodes.
In: European Symposium of Electron Devices, Failure Physics and Analysis <8, 1997, Arcachon, France>: Proceedings. S. 1691-1694, [Conference or Workshop Item]

Brandt, Michael and Schüßler, and Parmeggiani, and Lin, and Simon, and Hartnagel, (1997):
Thermal simulation and characterisation of the reliability of terahertz Schottky diodes.
In: European Symposium of Electron Devices, Failure Physics and Analysis <8, 1997, Arcachon, France>: Proceedings. S. 1663-1666, [Conference or Workshop Item]

Brandt, Michael and Schüßler, and Krozer, and Grajal, and Hartnagel, (1997):
Transmission line pulse based reliability investigations of HBTs.
In: European Gallium Arsenide and Related III-V Compounds Applications Symposium <5, 1997, Bologna, Italy>: Proceedings. S. 105-108, [Conference or Workshop Item]

Brandt, Michael and Schüßler, and Lin, and Simon, and Hartnagel, (1997):
Transmission line pulse based reliability investigations of THz Schottky diodes.
In: ESA Electronic Components Conference <3, 1997, Noordwijk, NL>: Proceedings. S. 29-34, [Conference or Workshop Item]

Krozer, Viktor and Ruppert, and Schüßler, and Fricke, and Lee, and Hartmann, (1996):
Calculation of the power capabilities of HBT amplifiers based on a new physical HBT model.
In: International journal of microwave and millimeter-wave computer-aided engineering. 6 (1996), No. 4, S. 270-280, [Article]

Brandt, Michael and Krozer, and Schüßler, and Bock, and Hartnagel, (1996):
Characterisation of reliability of compound semiconductor devices using electrical pulses.
In: Microelectronics and reliability. 36 (1996), S. 1891-1894, [Article]

Brandt, Michael and Schüßler, and Hartnagel, (1996):
Characterisation of the reliability of planar Schottky diodes for millimetre and submillimetre wave applications.
In: European Space Research and Technology Centre: ESA-ESTEC <1996, Noordwijk, NL>: Proceedings, [Conference or Workshop Item]

Fricke, K. and Krozer, and Schüßler, (1996):
Comparison of MESFET, HEMT, and HBT device performance at high temperatures.
In: High - Temperature Electronics Conference <1996, Albuquerque, NM, USA>: Proceedings, [Conference or Workshop Item]

Gehrig, Hans and Schüßler, and Kluge, (1996):
Geosiphon pyriforme, a fungus forming edocytobiosis with Nostoc (Cyanobacteria), is an ancestral member of the Glomales: evidence by SSUrRNA analysis.
In: Journal of molecular evolution. 43 (1996), S. 71-81, [Article]

Krozer, Viktor and Würfl, and Fricke, and Schüßler, and Lee, and Hartnagel, (1995):
High temperature electronics with III-V compound semiconductors.
In: HITEN (High temperature electronics network) - news. 1995, Nr. 9, [Article]

Krozer, Viktor and Schüßler, and Fricke, and Lee, and Hartnagel, (1995):
High temperature microwave modeling and circuit design with MESFET's and HBT's.
In: International Symposium on Signals, Systems and Electronics: ISSE '95 <1995, San Francisco, USA>: Proceedings, [Conference or Workshop Item]

Pirling, Thilo and Fricke, and Schüßler, and Lee, and Fuess, H. and Hartnagel, H. L. (1995):
Investigations on Pd/In-based high temperature stable ohmic contacts on GaAs by x-ray reflectometry and diffractometry.
In: Materials science and engineering. B 29 (1995), S. 70-73, [Article]

This list was generated on Sat Jun 22 01:47:01 2019 CEST.