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Number of items: 6.

Schmidt, K.-H. and Buschhorn, and Kotthaus, and Rzepka, M. and Weinmann, P. M. and Morokhovskyi, V. V. and Freudenberger, J. and Genz, H. and Richter, A. (1998):
Measurement of the linear polarization of parametric X-radiation.
In: Nuclear instruments and methods in physics research. B 145 (1998), S. 8-13, [Article]

Weinmann, Peter M. and Rzepka, M. and Buschhorn, G. and Kotthaus, R. and Schmidt, K. H. and Freudenberger, J. and Genz, H. and Morokhovskyi, V. V. and Richter, A. (1998):
Spectral-angular and polarization properties of near-axis channeling radiation of 31 MeV electrons in silicon.
In: Nuclear instruments and methods in physics research. B 145 (1998), S. 113-119, [Article]

Freudenberger, Jörg and Genz, H. and Kotthaus, R. and Morokhovskyi, V. V. and Morokhovskyi, V. L. and Rzepka, M. and Schmidt, and Weinmann, P. M. and Richter, A. (1997):
Polarisation parametrischer Röntgenstrahlung.
In: Verhandlungen der Deutschen Physikalischen Gesellschaft. R. 6. Bd. 32 (1997), S. 31, [Article]

Buschhorn, G. and Diedrich, E. and Kufner, W. and Rzepka, M. and Genz, H. and Hoffmann-Stascheck, P. and Richter, A. (1997):
Temperature dependence of planar channeling radiation in silicon, germanium, and beryllium between 12 and 330 K.
In: Physical review. B 55 (1997), S. 6196-6202, [Article]

Weinmann, Peter M. and Buschhorn, G. and Kotthaus, R. and Rzepka, M. and Schmidt, K. H. and Genz, H. and Hoffmann-Stascheck, P. and Richter, A. (1997):
A crystal monochromator for a linearly polarized X-ray source utilizing channeling radiation.
In: Nuclear instruments and methods in physics research. A 387 (1997), S. 450-458, [Article]

Rzepka, M. and Buschhorn, G. and Diedrich, E. and Kotthaus, R. and Kufner, W. and Rössl, and Schmidt, K. H. and Hoffmann-Stascheck, P. and Genz, H. (1995):
Measurement of the linear polarization of channeling radiation in silicon and diamond.
In: Physical review. B 52 (1995), S. 771-777, [Article]

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