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Reuling, Dennis and Bürdek, Johannes and Rotärmel, Serge and Lochau, Malte and Kelter, Udo :
Fault-based product-line testing: effective sample generation based on feature-diagram mutation.
[Online-Edition: http://doi.acm.org/10.1145/2791060.2791074]
Proceedings of the 19th International Conference on Software Product Line (SPLC)
[Conference or Workshop Item] , (2015)

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