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Fault-based product-line testing: effective sample generation based on feature-diagram mutation

Reuling, Dennis and Bürdek, Johannes and Rotärmel, Serge and Lochau, Malte and Kelter, Udo :
Fault-based product-line testing: effective sample generation based on feature-diagram mutation.
[Online-Edition: http://doi.acm.org/10.1145/2791060.2791074]
Proceedings of the 19th International Conference on Software Product Line (SPLC)
[Conference or Workshop Item] , (2015)

Official URL: http://doi.acm.org/10.1145/2791060.2791074
Item Type: Conference or Workshop Item
Erschienen: 2015
Creators: Reuling, Dennis and Bürdek, Johannes and Rotärmel, Serge and Lochau, Malte and Kelter, Udo
Title: Fault-based product-line testing: effective sample generation based on feature-diagram mutation
Language: English
Title of Book: Proceedings of the 19th International Conference on Software Product Line (SPLC)
Divisions: 18 Department of Electrical Engineering and Information Technology > Institute of Computer Engineering > Real-Time Systems
18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute of Computer Engineering
Date Deposited: 15 Feb 2016 20:34
Official URL: http://doi.acm.org/10.1145/2791060.2791074
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