Reuling, Dennis and Bürdek, Johannes and Rotärmel, Serge and Lochau, Malte and Kelter, Udo
:
Fault-based product-line testing: effective sample generation based on feature-diagram mutation.
[Online-Edition: http://doi.acm.org/10.1145/2791060.2791074]
Proceedings of the 19th International Conference on Software Product Line (SPLC)
[Conference or Workshop Item]
, (2015)
Official URL: http://doi.acm.org/10.1145/2791060.2791074
| Item Type: | Conference or Workshop Item |
|---|---|
| Erschienen: | 2015 |
| Creators: | Reuling, Dennis and Bürdek, Johannes and Rotärmel, Serge and Lochau, Malte and Kelter, Udo |
| Title: | Fault-based product-line testing: effective sample generation based on feature-diagram mutation |
| Language: | English |
| Title of Book: | Proceedings of the 19th International Conference on Software Product Line (SPLC) |
| Divisions: | 18 Department of Electrical Engineering and Information Technology > Institute of Computer Engineering > Real-Time Systems 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute of Computer Engineering |
| Date Deposited: | 15 Feb 2016 20:34 |
| Official URL: | http://doi.acm.org/10.1145/2791060.2791074 |
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