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Ketov, S. V. ; Ivanov, Yu P. ; Sopu, D. ; Louzguine-Luzgin, D. V. ; Suryanarayana, C. ; Rodin, A. O. ; Schöberl, T. ; Greer, A. L. ; Eckert, J. (2019):
High-resolution transmission electron microscopy investigation of diffusion in metallic glass multilayer films.
1, In: Materials Today Advances, 2019, p. 100004. Elsevier Ltd., ISSN 25900498,
DOI: 10.1016/j.mtadv.2019.01.003,
[Article]

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