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Ketov, S. V. and Ivanov, Yu P. and Sopu, D. and Louzguine-Luzgin, D. V. and Suryanarayana, C. and Rodin, A. O. and Schöberl, T. and Greer, A. L. and Eckert, J. (2019):
High-resolution transmission electron microscopy investigation of diffusion in metallic glass multilayer films.
In: Materials Today Advances, 12019. Elsevier Ltd., p. 100004, ISSN 25900498,
DOI: 10.1016/j.mtadv.2019.01.003,
[Online-Edition: https://doi.org/10.1016/j.mtadv.2019.01.003],
[Article]

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