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Bichlmeier, S. and Janssens, K. and Heckel, J. and Hoffmann, Peter and Ortner, H. M. :
Comparative material characterization of historical and industrial samples by using a compact micro-XRF spectrometer.
[Online-Edition: http://dx.doi.org/10.1002/xrs.563]
In: X-Ray Spectrometry, 31 (1) pp. 87-91.
[Article] , (2002)

Bichlmeier, S. and Janssens, K. and Heckel, J. and Gibson, D. and Hoffmann, Peter and Ortner, H. M. :
Component selection for a compact micro-XRF spectrometer.
[Online-Edition: http://dx.doi.org/10.1002/xrs.457]
In: X-Ray Spectrometry, 30 (1) pp. 8-14.
[Article] , (2001)

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