Bichlmeier, S. ; Janssens, K. ; Heckel, J. ; Hoffmann, Peter ; Ortner, H. M. (2002)
Comparative material characterization of historical and industrial samples by using a compact micro-XRF spectrometer.
In: X-Ray Spectrometry, 31 (1)
Artikel, Bibliographie

Bichlmeier, S. ; Janssens, K. ; Heckel, J. ; Gibson, D. ; Hoffmann, Peter ; Ortner, H. M. (2001)
Component selection for a compact micro-XRF spectrometer.
In: X-Ray Spectrometry, 30 (1)
Artikel, Bibliographie