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Comparative material characterization of historical and industrial samples by using a compact micro-XRF spectrometer

Bichlmeier, S. and Janssens, K. and Heckel, J. and Hoffmann, Peter and Ortner, H. M. :
Comparative material characterization of historical and industrial samples by using a compact micro-XRF spectrometer.
[Online-Edition: http://dx.doi.org/10.1002/xrs.563]
In: X-Ray Spectrometry, 31 (1) pp. 87-91.
[Article] , (2002)

Official URL: http://dx.doi.org/10.1002/xrs.563
Item Type: Article
Erschienen: 2002
Creators: Bichlmeier, S. and Janssens, K. and Heckel, J. and Hoffmann, Peter and Ortner, H. M.
Title: Comparative material characterization of historical and industrial samples by using a compact micro-XRF spectrometer
Language: English
Journal or Publication Title: X-Ray Spectrometry
Volume: 31
Number: 1
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Material Analytics
Date Deposited: 03 Feb 2010 13:23
Official URL: http://dx.doi.org/10.1002/xrs.563
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