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Number of items: 8.

Freund, Dirk ; Kostka, (2008):
A new physical compact model of CLBTs for circuit simulation including two-dimensional calculations.
In: Simulation of semiconductor devices and processes. Vol. 6. Hrsg.: H. Ryssel (u.a.) S. 344-347, [Book Section]

Freund, Dirk (1996):
Analytical theory of gate-induced injection barrier modulation in compensated CMOS-compatible bipolar transistors.
In: European Solid-State Device Research Conference ESSDERC '96 <26, 1996, Bologna>: Proc. Hrsg.: G. Baccarani (u.a.) S. 973-976, Gif-sur-Yvette: Ed. Frontiers, 1996, Gif-sur-Yvette, Ed. Frontiers, [Conference or Workshop Item]

Freund, Dirk (1996):
Analytical theory of gate-induced injection barrier modulation in compensated CMOS-compatible bipolar transistors.
In: European Solid-State Device Research Conference ESSDERC '96 <26, 1996, Bologna>: Proc. Hrsg.: G. Baccarani (u.a.) S. 973-976, Gif-sur-Yvette: Ed. Frontiers, 1996, Gif-sur-Yvette, Ed. Frontiers, [Conference or Workshop Item]

Freund, Dirk (1996):
Conformal mapping techniques for the analytical, 2-dimensional calculation of currents in lateral bipolar transistor structures.
In: Solid-state electronics. 39 (1996), S. 529-540, [Article]

Freund, Dirk (1996):
Conformal mapping techniques for the analytical, 2-dimensional calculation of currents in lateral bipolar transistor structures.
In: Solid-state electronics. 39 (1996), S. 529-540, [Article]

Freund, Dirk ; Kostka, ; Kostka, (1996):
A new physical, quasi 3-D, compact model of lateral bipolar transistors for circuit simulation.
In: IEEE Bipolar Circuit and Technology Meeting <1996, Minneapolis>: Proceedings, [Conference or Workshop Item]

Freund, Dirk (1995):
Strukturnahe analytische Kompaktmodellierung lateraler Bipolartransistoren.
216, Düsseldorf: VDI-Verl., 1995. XIII, 199 S., Düsseldorf, VDI-Verl, TU Darmstadt,
[Ph.D. Thesis]

Freund, Dirk ; Kostka, (1995):
An analytical model of the V BE-dependence of current splitting in CMOS-compativle lateral bipolar transistors.
In: Solid-state electronics. 38 (1995), No. 8, S. 1543-1546, [Article]

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