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Yue, Yao and Feng, Lihong and Benner, Peter and Pulch, Roland and Schöps, Sebastian (2019):
Reduced Models and Uncertainty Quantification.
In: Mathematics in Industry, In: Nanoelectronic Coupled Problems Solutions, Cham, Springer, pp. 329-346, DOI: 10.1007/978-3-030-30726-4_15,
[Online-Edition: https://link.springer.com/chapter/10.1007/978-3-030-30726-4_...],
[Book Section]
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